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hits | 3250 N Post Rd Ste 120, Indianapolis, IN 46226
1 317 895 5630
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Overview:
Advanced Surface Microscopy, Inc. is an independent analytical/contract research laboratory. We are dedicated to providing outstanding analytical services, research and consulting to developers, producers and users of advanced materials and devices. Our Staff: All technical work is supervised by Dr. Donald A. Chernoff. Dr. Chernoff holds a Ph.D. in Physical Chemistry (University of Chicago) and has about 25 years industrial research experience; he has been active in the field of scanning probe microscopy since its development in 1986. His significant contributions in the area of laser spectroscopy and optics, electron microscopy and the practical application of microscopy to process improvement have resulted in over 40 publications and patents. David Burkhead, has a B.S. in Physics (University of Akron) and has been providing distinguished SPM analysis and software development at ASM since 1997. Our Experience: Any surface that you can touch can, in theory, be examined by the AFM. Since 1990, we have provided more than 1000 analytical projects for more than 200 customers, examining more than 100 types of materials and devices. We are especially proud of two contributions to microscopy and materials analysis: - In November 1994, ASM became the first lab outside of Digital Instruments to make a tapping mode phase image and to recognize that it was important for materials analysis in general... | |
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